JAVELIN J800 CONFIGURATIONS

JAVELIN J800 CONFIGURATIONS

Javelin  J800 EX

The Javelin J800 EX is a new generation 200Mhz small footprint tester system.

This model can be configured as either:

  • 256-I/O channels full digital tester,
  • 128-channel full analog tester, or

Mixed-signal tester,

Highly recommended for:

  • Test development engineering projects,
  • Test engineering tester, and/or
  • High Parallel testing for both wafer and Strip Test Applications

Javelin  J800 MX1

The Javelin J800 MX1 is a new generation 200Mhz small footprint Test System.

This model can be configured as either:

  • 768 I/O channels full digital tester,
  • 384-channel full analog tester, or
  • Mixed-signal tester,

Highly recommended for:

  • Test development engineering projects,
  • Test engineering tester, and/or
  • High parallelism strip-testing of devices
  • High Parallel testing for both wafer and Strip Test Applications

Javelin  J800 MX2

The Javelin J800 MX2 is a new generation 200Mhz small footprint tester system.

This model can be configured as either:

  • 1536 I/O channels full digital tester,
  • 768-channel full analog tester, or
  • Mixed-signal tester,

Highly recommended for:

  • Testing devices with high pin counts multiple sites parallelism testing
  • Very high parallelism Strip-testing of devices
  • High Parallel testing for both wafer and Strip Test Applications

Javelin  J800 MXQ

The Javelin J800 MXQ is a new generation 200Mhz small footprint tester system.

This model can be configured as either:

  • 3072 I/O channels full digital tester,
  • 1536-channel full analog tester, or
  • Mixed-signal tester,

Highly recommended for:

  • Testing devices with high pin counts multiple sites parallelism testing
  • Ultra-high parallelism Strip-testing of devices
  • Multiple sites parallel testing for NVMs, MCUs, PMICs, Sensors, Analog and Logic devices